Effect of Magnetic Field Configuration of Dual Magnetron on Carbon Based Films Properties; Advanced Materials Research; Vol. 1040 : High Technology: Research and Applications 2014 (HTRA 2014)

Бібліографічні деталі
Parent link:Advanced Materials Research: Scientific Journal
Vol. 1040 : High Technology: Research and Applications 2014 (HTRA 2014).— 2014.— [P. 721-725]
Співавтор: Национальный исследовательский Томский политехнический университет Физико-технический институт Кафедра водородной энергетики и плазменных технологий
Інші автори: Yuriev Yu. N. Yuri Nikolaevich, Zaitsev D. A. Danila Aleksandrovich, Sidelev D. V. Dmitry Vladimirovich, Tupikova O. S. Olga Sergeevna
Резюме:Title screen
The article reports on the influence of magnetic field (B field) configuration of dual magnetron on carbon based films properties. The films deposition was performed by means of magnetron sputtering of carbon targets in argon plasma at total pressure range (0.1-1.6 Pa). The carbon films aren’t composed of chemical impurities as measured by Auger electron spectroscopy (AES). The B field configurations affect to a greater extent on mechanical properties and don’t have weighty impact on deposition rates. For «mirror» B field, the films hardness (H) is a higher. The rise of Ar pressure results in a decrease H from 20 to 9 GPa. It is peculiar to a-C and ta-C films. The effect of B field configurations on elastic module (E) is shown in higher pressures.
Режим доступа: по договору с организацией-держателем ресурса
Мова:Англійська
Опубліковано: 2014
Серія:Technologies of Electrophysical Methods of Materials Treatment
Предмети:
Онлайн доступ:http://dx.doi.org/10.4028/www.scientific.net/AMR.1040.721
Формат: Електронний ресурс Частина з книги
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=641105

MARC

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