Positron annihilation spectroscopy of vacancy-type defects hierarchy in submicrocrystalline nickel during annealing

Positron annihilation spectroscopy of vacancy-type defects hierarchy in submicrocrystalline nickel during annealing

Bibliographic Details
Parent link:AIP Conference Proceedings
Vol. 1623 : International Conference on Physical Mesomechanics of Multilevel Systems 2014, Tomsk, Russia, 3–5 September 2014.— 2014.— [P. 327-330]
Corporate Author: Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра общей физики (ОФ)
Other Authors: Kuznetsov P. V. Pavel Viktorovich, Mironov Yu. P., Tolmachev A. I., Rakhmatulina T. V., Bordulev Yu. S. Yuri Sergeevich, Laptev R. S. Roman Sergeevich, Lider A. M. Andrey Markovich, Mikhailov A. A. Andrey Anatolievich, Korznikov A. V.
Summary:Title screen
Positron annihilation and X-ray diffraction analysis have been used to study submicrocrystalline nickel samples prepared by equal channel angular pressing. In the as-prepared samples the positrons are trapped at dislocation-type defects and in vacancy clusters that can include up to 5 vacancies. The study has revealed that the main positron trap centers at the annealing temperature of deltaT=20°C-180°C are low-angle boundaries enriched by impurities. At deltaT=180°C-360°C, the trap centers are low-angle boundaries providing the grain growth due to recrystallization in-situ.
Режим доступа: по договору с организацией-держателем ресурса
Published: 2014
Subjects:
электронный ресурс
труды учёных ТПУ
submicrocrystalline structure
subgrain
grain boundary
low-angle boundary
positron annihilation
dislocations
vacancy cluster
annealing
аннигиляция
позитроны
спектроскопия
дефекты
никель
отжиг
субмикрокристаллические структуры
Online Access:http://dx.doi.org/10.1063/1.4901488
http://earchive.tpu.ru/handle/11683/35670
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=641049

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