Positron annihilation spectroscopy of vacancy-type defects hierarchy in submicrocrystalline nickel during annealing; AIP Conference Proceedings; Vol. 1623 : International Conference on Physical Mesomechanics of Multilevel Systems 2014, Tomsk, Russia, 3–5 September 2014
| Parent link: | AIP Conference Proceedings Vol. 1623 : International Conference on Physical Mesomechanics of Multilevel Systems 2014, Tomsk, Russia, 3–5 September 2014.— 2014.— [P. 327-330] |
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| निगमित लेखक: | |
| अन्य लेखक: | , , , , , , , , |
| सारांश: | Title screen Positron annihilation and X-ray diffraction analysis have been used to study submicrocrystalline nickel samples prepared by equal channel angular pressing. In the as-prepared samples the positrons are trapped at dislocation-type defects and in vacancy clusters that can include up to 5 vacancies. The study has revealed that the main positron trap centers at the annealing temperature of deltaT=20°C-180°C are low-angle boundaries enriched by impurities. At deltaT=180°C-360°C, the trap centers are low-angle boundaries providing the grain growth due to recrystallization in-situ. Режим доступа: по договору с организацией-держателем ресурса |
| भाषा: | अंग्रेज़ी |
| प्रकाशित: |
2014
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| विषय: | |
| ऑनलाइन पहुंच: | http://dx.doi.org/10.1063/1.4901488 http://earchive.tpu.ru/handle/11683/35670 |
| स्वरूप: | इलेक्ट्रोनिक पुस्तक अध्याय |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=641049 |
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