Performance Evaluation of Micro-CT Scanners as Visualization Systems

Bibliografische gegevens
Parent link:Computation, Automation, Information Technologies and Safety Systems in Nuclear Industry: Scientific Journal
Vol. 1084 : Physical-Technical Problems of Nuclear Science, Energy Generation, and Power Industry (PTPAI -2014).— 2015.— [P. 694-697]
Hoofdauteur: Batranin A. V. Andrey Viktorovich
Coauteurs: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Лаборатория № 40 (Технической томографии и интроскопии) (Лаборатория № 40), Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра прикладной физики (№ 12) (ПФ)
Andere auteurs: Ivashkov D., Stuchebrov S. G. Sergey Gennadevich
Samenvatting:Title screen
High-resolution X-ray tomography, also known as micro-computed tomography (micro-CT) or microtomography, is a versatile evaluation technique, which extends application in various fields including material science. Micro-CT is a suitable method for quantitative and dimensional materials characterization. Needless to say, the accuracy of the method and applied equipments – micro-CT scanners – should be assessed to obtain reliable, solid results. In this paper, the performance of a micro-CT scanner as a visualization system is discussed. Quantitative parameters of image quality and visualization systems as well as methods to obtain their numerical values are briefly described. The results of experiments carried out on in-house made micro-CT scanner TOLMI-150-10 developed in Tomsk Polytechnic University are presented.
Режим доступа: по договору с организацией-держателем ресурса
Taal:Engels
Gepubliceerd in: 2015
Reeks:Radiation Technologies in Medicine
Onderwerpen:
Online toegang:http://dx.doi.org/10.4028/www.scientific.net/AMR.1084.694
Formaat: Elektronisch Hoofdstuk
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=640519
Omschrijving
Samenvatting:Title screen
High-resolution X-ray tomography, also known as micro-computed tomography (micro-CT) or microtomography, is a versatile evaluation technique, which extends application in various fields including material science. Micro-CT is a suitable method for quantitative and dimensional materials characterization. Needless to say, the accuracy of the method and applied equipments – micro-CT scanners – should be assessed to obtain reliable, solid results. In this paper, the performance of a micro-CT scanner as a visualization system is discussed. Quantitative parameters of image quality and visualization systems as well as methods to obtain their numerical values are briefly described. The results of experiments carried out on in-house made micro-CT scanner TOLMI-150-10 developed in Tomsk Polytechnic University are presented.
Режим доступа: по договору с организацией-держателем ресурса
DOI:10.4028/www.scientific.net/AMR.1084.694