Control over Hard X-Ray Parameters Using External Temperature Gradient

Control over Hard X-Ray Parameters Using External Temperature Gradient

Dades bibliogràfiques
Parent link:Advanced Materials Research : Radiation and nuclear techniques in material science: Scientific Journal
Vol. 1084 : Physical-Technical Problems of Nuclear Science, Energy Generation, and Power Industry (PTPAI -2014).— 2015.— [P. 107-110]
Autor corporatiu: Национальный исследовательский Томский политехнический университет
Altres autors: Kocharian V. R. Vagan Rashidovich, Mkrtchan (Mkrtchyan) A. R. Alpik Rafaelovich, Gogolev A. S. Aleksey Sergeevich, Khlopuzyan S., Grigoryan P.
Sumari:Title screen
In order to gain control over hard X-ray (over 30 keV), we have considered the X-ray diffraction in Laue geometry (over 30 keV) from a single crystal of quartz influenced by the temperature gradient. It was experimentally proved that the intensity of the reflected beam can be increased up to 35 times if the X-ray energies are 30 keV and keV for reflecting atomic planes () depending on the value of the temperature gradient. As the temperature gradient increases, the focus moves closer to the crystal and the focal spot shrinks in the diffraction plane.
Режим доступа: по договору с организацией-держателем ресурса
Idioma:anglès
Publicat: 2015
Col·lecció:Plasma, Microwave, Ion, Electron and Isotope Technologies
Matèries:
электронный ресурс
труды учёных ТПУ
дифракция
градиенты
температурные градиенты
Accés en línia:http://dx.doi.org/10.4028/www.scientific.net/AMR.1084.107
Format: Electrònic Capítol de llibre
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=640248
Descripció
Sumari:Title screen
In order to gain control over hard X-ray (over 30 keV), we have considered the X-ray diffraction in Laue geometry (over 30 keV) from a single crystal of quartz influenced by the temperature gradient. It was experimentally proved that the intensity of the reflected beam can be increased up to 35 times if the X-ray energies are 30 keV and keV for reflecting atomic planes () depending on the value of the temperature gradient. As the temperature gradient increases, the focus moves closer to the crystal and the focal spot shrinks in the diffraction plane.
Режим доступа: по договору с организацией-держателем ресурса
DOI:10.4028/www.scientific.net/AMR.1084.107

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