Influence of Carbon Pulse Ion Beam on Titanium Alloy; Advanced Materials Research : Radiation and nuclear techniques in material science; Vol. 1084 : Physical-Technical Problems of Nuclear Science, Energy Generation, and Power Industry (PTPAI -2014)

Dettagli Bibliografici
Parent link:Advanced Materials Research : Radiation and nuclear techniques in material science: Scientific Journal
Vol. 1084 : Physical-Technical Problems of Nuclear Science, Energy Generation, and Power Industry (PTPAI -2014).— 2015.— [P. 30-33]
Ente Autore: Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра общей физики (ОФ)
Altri autori: Beloglazova P. A. Polina Andreevna, Chernov I. P. Ivan Petrovich, Cherdantsev Yu. P. Yuriy Petrovich, Pushilina N. S. Natalia Sergeevna
Riassunto:Title screen
We have researched the influence of the carbon pulse ion beam on samples of technical titanium VT1-0. The beam energy was 200 kV; the pulse duration, 80 ns; the energy density, 1.92 J/cm{2}. It was established that the 1.8 µm deep modified layer with high hardness and low rate of hydrogen sorption in the bulk of material was formed during the exposure to the carbon pulse ion beam.
Режим доступа: по договору с организацией-держателем ресурса
Lingua:inglese
Pubblicazione: 2015
Serie:Materials Science and Technologies
Soggetti:
Accesso online:http://dx.doi.org/10.4028/www.scientific.net/AMR.1084.30
Natura: Elettronico Capitolo di libro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=640204
Descrizione
Riassunto:Title screen
We have researched the influence of the carbon pulse ion beam on samples of technical titanium VT1-0. The beam energy was 200 kV; the pulse duration, 80 ns; the energy density, 1.92 J/cm{2}. It was established that the 1.8 µm deep modified layer with high hardness and low rate of hydrogen sorption in the bulk of material was formed during the exposure to the carbon pulse ion beam.
Режим доступа: по договору с организацией-держателем ресурса
DOI:10.4028/www.scientific.net/AMR.1084.30