Increase resource power electronics module on the physics of failure method; MATEC Web of Conferences; Vol. 19 : The 2nd International Youth Forum “Smart Grids”, Tomsk, Russia, October 6-10, 2014
| Parent link: | MATEC Web of Conferences Vol. 19 : The 2nd International Youth Forum “Smart Grids”, Tomsk, Russia, October 6-10, 2014.— 2014.— [01028 [6 p.]] |
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| Hlavní autor: | |
| Korporace: | , |
| Další autoři: | |
| Shrnutí: | Title screen A new approach to improving resource devices for power electronics. The numerical analysis of non-uniform temperature field of power semiconductor devices. A comparison of the intensities of the failure of a power unit with the real thermal regime of the device under conditions of natural convection and obtained by using statistical data analysis. The integrated assessment of reliability based on the methods of physics failures. The necessity of taking into account the actual non-stationary temperature fields to improve the reliability of the forecast operating life of power semiconductor devices. |
| Jazyk: | angličtina |
| Vydáno: |
2014
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| Témata: | |
| On-line přístup: | http://dx.doi.org/10.1051/matecconf/20141901028 |
| Médium: | MixedMaterials Elektronický zdroj Kapitola |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=640152 |
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| 200 | 1 | |a Increase resource power electronics module on the physics of failure method |f E. V. Kravchenko, G. V. Kuznetsov | |
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| 300 | |a Title screen | ||
| 320 | |a [References: 23 tit.] | ||
| 330 | |a A new approach to improving resource devices for power electronics. The numerical analysis of non-uniform temperature field of power semiconductor devices. A comparison of the intensities of the failure of a power unit with the real thermal regime of the device under conditions of natural convection and obtained by using statistical data analysis. The integrated assessment of reliability based on the methods of physics failures. The necessity of taking into account the actual non-stationary temperature fields to improve the reliability of the forecast operating life of power semiconductor devices. | ||
| 461 | 0 | |0 (RuTPU)RU\TPU\network\4526 |t MATEC Web of Conferences | |
| 463 | 0 | |0 (RuTPU)RU\TPU\network\4524 |t Vol. 19 : The 2nd International Youth Forum “Smart Grids”, Tomsk, Russia, October 6-10, 2014 |o [proceedings] |f National Research Tomsk Polytechnic University (TPU) |v [01028 [6 p.]] |d 2014 | |
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a модули | |
| 610 | 1 | |a силовая электроника | |
| 610 | 1 | |a отказы | |
| 610 | 1 | |a численный анализ | |
| 610 | 1 | |a полупроводниковые приборы | |
| 610 | 1 | |a тепловые режимы | |
| 610 | 1 | |a надежность | |
| 610 | 1 | |a температурные поля | |
| 610 | 1 | |a эксплуатация | |
| 700 | 1 | |a Kravchenko |b E. V. |c specialist in the field of power engineering |c Associate Professor of Tomsk Polytechnic University, Candidate of technical sciences |f 1981- |g Evgeny Vladimirovich |3 (RuTPU)RU\TPU\pers\32852 |9 16700 | |
| 701 | 1 | |a Kuznetsov |b G. V. |c Specialist in the field of heat power energy |c Professor of Tomsk Polytechnic University, Doctor of Physical and Mathematical Sciences |f 1949- |g Geny Vladimirovich |3 (RuTPU)RU\TPU\pers\31891 |9 15963 | |
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