X-ray production simulation of an electron beam recycled through a betatron's internal target

X-ray production simulation of an electron beam recycled through a betatron's internal target

Bibliographic Details
Parent link:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms: Scientific Journal
Vol. 145, iss. 1-2.— 1998.— [P. 244-252]
Other Authors: Kaplin V. V. Valeriy Viktorovich, Lombardo L. W., Mikhalchuk A. A. Aleksandr Alexandrovich, Piestrup M. A., Uglov S. R. Sergey Romanovich
Summary:Title screen
An analysis of the circulating dynamics of 6 and 35 MeV electron beams in betatron chambers with quasi-transparent internal targets has been done by means of computer simulation. The spatial and angular distributions of the electron trajectories were studied as the electrons made multiple passes through the thin targets. The beam intensities were observed as a function of the number of passes through 0.01, 0.02, 0.05, and 0.1 mm thick silicon targets. The mean number of passes that an electron makes was determined for each combination of target thickness and beam energy. Using the data obtained from the simulation, the spectral and angular distributions of parametric X-radiation have been calculated for electrons recycled through silicon crystals.
Режим доступа: по договору с организацией-держателем ресурса
Language:English
Published: 1998
Subjects:
электронный ресурс
труды учёных ТПУ
Online Access:http://www.sciencedirect.com/science/article/pii/S0168583X98003772
http://elibrary.ru/item.asp?id=13280532
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=639901

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