Advanced IR sensing technology researchings in the city of Tomsk, USSR; Thermosense XII, Orlando, FL, United States, April 20, 1990

Podrobná bibliografie
Parent link:Thermosense XII, Orlando, FL, United States, April 20, 1990.— 1990.— [P. 307-308]
Další autoři: Vavilov V. P. Vladimir Platonovich, Ivanov A. I., Isakov A. V., Reino V. V., Shiryaev V. V. Vladimir Vasilyevich, Tsvyk V. V. Ruvim S.
Shrnutí:Title screen
Development of thermophysical approach to the solution of thermal nondestructive testing has led to the so called 'dynamic thermal tomography" which allows to picturize the in-deep distribution of thermophysical properties including defects' description. Some aspects of the thermal tomography are discussed
Режим доступа: по договору с организацией-держателем ресурса
Jazyk:angličtina
Vydáno: 1990
Témata:
On-line přístup:http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=945256
Médium: Elektronický zdroj Kapitola
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=637190

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320 |a [Ref.: p. 308 (2 tit.)] 
330 |a Development of thermophysical approach to the solution of thermal nondestructive testing has led to the so called 'dynamic thermal tomography" which allows to picturize the in-deep distribution of thermophysical properties including defects' description. Some aspects of the thermal tomography are discussed 
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701 1 |a Vavilov  |b V. P.  |c Specialist in the field of dosimetry and methodology of nondestructive testing (NDT)  |c Doctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU)  |f 1949-  |g Vladimir Platonovich  |3 (RuTPU)RU\TPU\pers\32161  |9 16163 
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701 1 |a Shiryaev  |b V. V.  |c specialist in the field of non-destructive testing  |c Senior researcher of Tomsk Polytechnic University, Candidate of technical sciences  |f 1948-  |g Vladimir Vasilyevich  |3 (RuTPU)RU\TPU\pers\32219  |9 16219 
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