Fracture processes studied in CRESST; Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment; Vol. 559, iss. 2

গ্রন্থ-পঞ্জীর বিবরন
Parent link:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment: Scientific Journal
Vol. 559, iss. 2.— 2006.— [P. 754-756]
অন্যান্য লেখক: Astrom J., Probst F., Stefano P.C.F. Di, Stodolsky L., Timonen J., Bucci C., Cooper S., Cozzini C., Feilitzsch F.v., Kraus H., Marchese J., Meier O., Nagel U., Ramachers Y., Seidel W., Sisti M., Uchaykin S. V. Sergey Victorovich, Zerle L.
সংক্ষিপ্ত:Title screen
In the early stages of running of the CRESST dark matter search with sapphire crystals as detectors, an unexpectedly high rate of signal pulses appeared. Their origin was finally traced to fracture events in the sapphire due to the very tight clamping of the detectors. During extensive runs the energy and time of each event was recorded, providing large data sets for such phenomena. We believe this is the first time that the energy release in fracture has been accurately measured on a microscopic event-by-event basis. The energy distributions appear to follow a power law, dN/dE∝E-βdN/dE∝E-β, similar to the Gutenberg–Richter power law for earthquake magnitudes, and after appropriate translation, with a similar exponent. In the time domain, the autocorrelation function shows time correlations lasting for substantial parts of an hour. Some remarks are made concerning the possible role of such mechanical stress release processes in the noise of sensitive cryodetectors
Режим доступа: по договору с организацией-держателем ресурса
ভাষা:ইংরেজি
প্রকাশিত: 2006
বিষয়গুলি:
অনলাইন ব্যবহার করুন:http://dx.doi.org/10.1016/j.nima.2005.12.127
বিন্যাস: বৈদ্যুতিক গ্রন্থের অধ্যায়
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=637155

MARC

LEADER 00000nla0a2200000 4500
001 637155
005 20250415123855.0
035 |a (RuTPU)RU\TPU\network\1252 
035 |a RU\TPU\network\794 
090 |a 637155 
100 |a 20140523d2006 k||y0rusy50 ba 
101 0 |a eng 
102 |a US 
135 |a drcn ---uucaa 
181 0 |a i  
182 0 |a b 
200 1 |a Fracture processes studied in CRESST  |f J. Astrom [et al.] 
203 |a Text  |c electronic 
300 |a Title screen 
320 |a [References: p. 756 (3 tit.)] 
330 |a In the early stages of running of the CRESST dark matter search with sapphire crystals as detectors, an unexpectedly high rate of signal pulses appeared. Their origin was finally traced to fracture events in the sapphire due to the very tight clamping of the detectors. During extensive runs the energy and time of each event was recorded, providing large data sets for such phenomena. We believe this is the first time that the energy release in fracture has been accurately measured on a microscopic event-by-event basis. The energy distributions appear to follow a power law, dN/dE∝E-βdN/dE∝E-β, similar to the Gutenberg–Richter power law for earthquake magnitudes, and after appropriate translation, with a similar exponent. In the time domain, the autocorrelation function shows time correlations lasting for substantial parts of an hour. Some remarks are made concerning the possible role of such mechanical stress release processes in the noise of sensitive cryodetectors 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
461 |t Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment  |o Scientific Journal 
463 |t Vol. 559, iss. 2  |v [P. 754-756]  |d 2006 
610 1 |a труды учёных ТПУ 
610 1 |a электронный ресурс 
701 1 |a Astrom  |b J. 
701 1 |a Probst  |b F. 
701 1 |a Stefano  |b P.C.F. Di 
701 1 |a Stodolsky  |b L. 
701 1 |a Timonen  |b J. 
701 1 |a Bucci  |b C. 
701 1 |a Cooper  |b S. 
701 1 |a Cozzini  |b C. 
701 1 |a Feilitzsch  |b F.v. 
701 1 |a Kraus  |b H. 
701 1 |a Marchese  |b J. 
701 1 |a Meier  |b O. 
701 1 |a Nagel  |b U. 
701 1 |a Ramachers  |b Y. 
701 1 |a Seidel  |b W. 
701 1 |a Sisti  |b M. 
701 1 |a Uchaykin  |b S. V.  |c specialist in the field of non-destructive testing  |c Engineer of Tomsk Polytechnic University, Doctor of physical and mathematical sciences  |f 1963-  |g Sergey Victorovich  |3 (RuTPU)RU\TPU\pers\32279 
701 1 |a Zerle  |b L. 
801 2 |a RU  |b 63413507  |c 20160512  |g RCR 
850 |a 63413507 
856 4 |u http://dx.doi.org/10.1016/j.nima.2005.12.127 
942 |c CF