Probing Noise in Flux Qubits via Macroscopic Resonant Tunneling; Physical Review Letters; Vol. 101, iss. 11
| Parent link: | Physical Review Letters: Scientific Journal.— , 1958- Vol. 101, iss. 11.— 2008.— [117003 , 4 p.] |
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| Outros Autores: | , , , , , , , , , , , , , , , |
| Resumo: | Title screen Macroscopic resonant tunneling between the two lowest lying states of a bistable rf SQUID is used to characterize noise in a flux qubit. Measurements of the incoherent decay rate as a function of flux biasrevealed a Gaussian-shaped profile that is not peaked at the resonance point but is shifted to a bias at which the initial well is higher than the target well. The rms amplitude of the noise, which is proportionalto the dephasing rate 1=’, was observed to be weakly dependent on temperature below 70 mK. Analysis of these results indicates that the dominant source of low energy flux noise in this device is a quantummechanical environment in thermal equilibrium Режим доступа: по договору с организацией-держателем ресурса |
| Idioma: | inglês |
| Publicado em: |
2008
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| Assuntos: | |
| Acesso em linha: | http://dx.doi.org/10.1103/PhysRevLett.101.117003 http://arxiv.org/abs/0712.0838 |
| Formato: | Recurso Eletrônico Capítulo de Livro |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=637146 |
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| 200 | 1 | |a Probing Noise in Flux Qubits via Macroscopic Resonant Tunneling |f R. Harris [et al.] | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: 18 tit.] | ||
| 330 | |a Macroscopic resonant tunneling between the two lowest lying states of a bistable rf SQUID is used to characterize noise in a flux qubit. Measurements of the incoherent decay rate as a function of flux biasrevealed a Gaussian-shaped profile that is not peaked at the resonance point but is shifted to a bias at which the initial well is higher than the target well. The rms amplitude of the noise, which is proportionalto the dephasing rate 1=’, was observed to be weakly dependent on temperature below 70 mK. Analysis of these results indicates that the dominant source of low energy flux noise in this device is a quantummechanical environment in thermal equilibrium | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 461 | |t Physical Review Letters |o Scientific Journal |d 1958- | ||
| 463 | |t Vol. 101, iss. 11 |v [117003 , 4 p.] |d 2008 | ||
| 610 | 1 | |a электронный ресурс | |
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| 701 | 1 | |a Harris |b R. | |
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| 856 | 4 | |u http://dx.doi.org/10.1103/PhysRevLett.101.117003 | |
| 856 | 4 | |u http://arxiv.org/abs/0712.0838 | |
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