Probing Noise in Flux Qubits via Macroscopic Resonant Tunneling; Physical Review Letters; Vol. 101, iss. 11

Detalhes bibliográficos
Parent link:Physical Review Letters: Scientific Journal.— , 1958-
Vol. 101, iss. 11.— 2008.— [117003 , 4 p.]
Outros Autores: Harris R., Johnson M. W., Han S., Berkley A. J., Johansson J., Bunyk P., Ladizinsky E., Govorkov S., Thom M. C., Uchaykin S. V. Sergey Victorovich, Bumble B., Fung A., Kaul A., Kleinsasser A., Amin M. H. S., Averin D. V.
Resumo:Title screen
Macroscopic resonant tunneling between the two lowest lying states of a bistable rf SQUID is used to characterize noise in a flux qubit. Measurements of the incoherent decay rate as a function of flux biasrevealed a Gaussian-shaped profile that is not peaked at the resonance point but is shifted to a bias at which the initial well is higher than the target well. The rms amplitude of the noise, which is proportionalto the dephasing rate 1=’, was observed to be weakly dependent on temperature below 70 mK. Analysis of these results indicates that the dominant source of low energy flux noise in this device is a quantummechanical environment in thermal equilibrium
Режим доступа: по договору с организацией-держателем ресурса
Idioma:inglês
Publicado em: 2008
Assuntos:
Acesso em linha:http://dx.doi.org/10.1103/PhysRevLett.101.117003
http://arxiv.org/abs/0712.0838
Formato: Recurso Eletrônico Capítulo de Livro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=637146

MARC

LEADER 00000nla0a2200000 4500
001 637146
005 20250415122636.0
035 |a (RuTPU)RU\TPU\network\1243 
035 |a RU\TPU\network\289 
090 |a 637146 
100 |a 20140520d2008 k||y0rusy50 ba 
101 0 |a eng 
102 |a US 
135 |a drcn ---uucaa 
181 0 |a i  
182 0 |a b 
200 1 |a Probing Noise in Flux Qubits via Macroscopic Resonant Tunneling  |f R. Harris [et al.] 
203 |a Text  |c electronic 
300 |a Title screen 
320 |a [References: 18 tit.] 
330 |a Macroscopic resonant tunneling between the two lowest lying states of a bistable rf SQUID is used to characterize noise in a flux qubit. Measurements of the incoherent decay rate as a function of flux biasrevealed a Gaussian-shaped profile that is not peaked at the resonance point but is shifted to a bias at which the initial well is higher than the target well. The rms amplitude of the noise, which is proportionalto the dephasing rate 1=’, was observed to be weakly dependent on temperature below 70 mK. Analysis of these results indicates that the dominant source of low energy flux noise in this device is a quantummechanical environment in thermal equilibrium 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
461 |t Physical Review Letters  |o Scientific Journal  |d 1958- 
463 |t Vol. 101, iss. 11  |v [117003 , 4 p.]  |d 2008 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
701 1 |a Harris  |b R. 
701 1 |a Johnson  |b M. W. 
701 1 |a Han  |b S. 
701 1 |a Berkley  |b A. J. 
701 1 |a Johansson  |b J. 
701 1 |a Bunyk  |b P. 
701 1 |a Ladizinsky  |b E. 
701 1 |a Govorkov  |b S. 
701 1 |a Thom  |b M. C. 
701 1 |a Uchaykin  |b S. V.  |c specialist in the field of non-destructive testing  |c Engineer of Tomsk Polytechnic University, Doctor of physical and mathematical sciences  |f 1963-  |g Sergey Victorovich  |3 (RuTPU)RU\TPU\pers\32279 
701 1 |a Bumble  |b B. 
701 1 |a Fung  |b A. 
701 1 |a Kaul  |b A. 
701 1 |a Kleinsasser  |b A. 
701 1 |a Amin  |b M. H. S. 
701 1 |a Averin  |b D. V. 
801 2 |a RU  |b 63413507  |c 20150416  |g RCR 
850 |a 63413507 
856 4 |u http://dx.doi.org/10.1103/PhysRevLett.101.117003 
856 4 |u http://arxiv.org/abs/0712.0838 
942 |c CF