Three-dimensional analysis of transient thermal NDT problems by data simulation and processing; Thermosense XXII, Orlando, April 24, 2000

Bibliografiska uppgifter
Parent link:Thermosense XXII, Orlando, April 24, 2000.— 2000.— [P. 152-163]
Huvudupphovsman: Vavilov V. P. Vladimir Platonovich
Sammanfattning:Title screen
he paper is devoted to the analysis of 2D and 3D numerical models, including such features as defect shape, overlapped and neighbor defects, uneven heating, spatial resolution of thermal NDT and the transition criteria for 1D-2D (3D) models
Режим доступа: по договору с организацией-держателем ресурса
Språk:engelska
Publicerad: 2000
Ämnen:
Länkar:http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=901866
Materialtyp: Elektronisk Bokavsnitt
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=637004

MARC

LEADER 00000naa0a2200000 4500
001 637004
005 20250920104704.0
035 |a (RuTPU)RU\TPU\network\1072 
090 |a 637004 
100 |a 20140424d2000 k||y0rusy50 ba 
101 0 |a eng 
102 |a US 
135 |a drnn ---uucaa 
181 0 |a i  
182 0 |a b 
200 1 |a Three-dimensional analysis of transient thermal NDT problems by data simulation and processing  |f V. P. Vavilov 
203 |a Text  |c electronic 
300 |a Title screen 
320 |a [References: p. 162-163 (12 tit.)] 
330 |a he paper is devoted to the analysis of 2D and 3D numerical models, including such features as defect shape, overlapped and neighbor defects, uneven heating, spatial resolution of thermal NDT and the transition criteria for 1D-2D (3D) models 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
463 1 |t Thermosense XXII, Orlando, April 24, 2000  |o Proc. SPIE 4020  |v [P. 152-163]  |d 2000 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a тепловой неразрушающий контроль 
610 1 |a thermal testing 
610 1 |a теплопроводность 
610 1 |a thermal conductivity 
610 1 |a численные модели 
610 1 |a numerical models 
700 1 |a Vavilov  |b V. P.  |c Specialist in the field of dosimetry and methodology of nondestructive testing (NDT)  |c Doctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU)  |f 1949-  |g Vladimir Platonovich  |3 (RuTPU)RU\TPU\pers\32161  |9 16163 
801 2 |a RU  |b 63413507  |c 20180316  |g RCR 
856 4 |u http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=901866 
942 |c CF