Sub-millimeter bunch length non-invasive diagnostic based on the diffraction and Cherenkov radiation; Journal of Physics: Conference Series; Vol. 357, Iss. 1

Бібліографічні деталі
Parent link:Journal of Physics: Conference Series
Vol. 357, Iss. 1.— 2012.— [012023 , 6 p.]
Інші автори: Shevelev M. V. Mihail Viktorovich, Deng H., Potylitsyn A. P. Alexander Petrovich, Naumenko G. A. Gennadiy Andreevich, Zhang J., Lu Sh., Gogolev S. Yu. Sergey Yurevich, Shkitov D. A. Dmitriy Andreevich
Резюме:Title screen
A layout for the investigation the coherent Cherenkov radiation from a dielectric target with a large spectral dispersion and the coherent diffraction radiation from a conducting screen as a tool for non-invasive longitudinal electron beam profile diagnostics are proposed for the 20~30MeV Linac at Shanghai Institute of Applied Physics (SINAP). In this paper the status of the joint experiment and future plans are presented
Мова:Англійська
Опубліковано: 2012
Предмети:
Онлайн доступ:http://dx.doi.org/10.1088/1742-6596/357/1/012023
Формат: Електронний ресурс Частина з книги
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=636315
Опис
Резюме:Title screen
A layout for the investigation the coherent Cherenkov radiation from a dielectric target with a large spectral dispersion and the coherent diffraction radiation from a conducting screen as a tool for non-invasive longitudinal electron beam profile diagnostics are proposed for the 20~30MeV Linac at Shanghai Institute of Applied Physics (SINAP). In this paper the status of the joint experiment and future plans are presented
DOI:10.1088/1742-6596/357/1/012023