Sub-millimeter bunch length non-invasive diagnostic based on the diffraction and Cherenkov radiation; Journal of Physics: Conference Series; Vol. 357, Iss. 1

Chi tiết về thư mục
Parent link:Journal of Physics: Conference Series
Vol. 357, Iss. 1.— 2012.— [012023 , 6 p.]
Tác giả khác: Shevelev M. V. Mihail Viktorovich, Deng H., Potylitsyn A. P. Alexander Petrovich, Naumenko G. A. Gennadiy Andreevich, Zhang J., Lu Sh., Gogolev S. Yu. Sergey Yurevich, Shkitov D. A. Dmitriy Andreevich
Tóm tắt:Title screen
A layout for the investigation the coherent Cherenkov radiation from a dielectric target with a large spectral dispersion and the coherent diffraction radiation from a conducting screen as a tool for non-invasive longitudinal electron beam profile diagnostics are proposed for the 20~30MeV Linac at Shanghai Institute of Applied Physics (SINAP). In this paper the status of the joint experiment and future plans are presented
Ngôn ngữ:Tiếng Anh
Được phát hành: 2012
Những chủ đề:
Truy cập trực tuyến:http://dx.doi.org/10.1088/1742-6596/357/1/012023
Định dạng: Điện tử Chương của sách
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=636315
Miêu tả
Tóm tắt:Title screen
A layout for the investigation the coherent Cherenkov radiation from a dielectric target with a large spectral dispersion and the coherent diffraction radiation from a conducting screen as a tool for non-invasive longitudinal electron beam profile diagnostics are proposed for the 20~30MeV Linac at Shanghai Institute of Applied Physics (SINAP). In this paper the status of the joint experiment and future plans are presented
DOI:10.1088/1742-6596/357/1/012023