Анализ и обработка АСМ-изображений анодного оксида алюминия
| Parent link: | Перспективы развития фундаментальных наук=Prospects of Fundamental Sciences Development: сборник научных трудов XVIII Международной конференции студентов, аспирантов и молодых ученых, г. Томск, 27-30 апреля 2021 г./ Национальный исследовательский Томский политехнический университет (ТПУ) ; под ред. И. А. Курзиной, Г. А. Вороновой.— , 2021 Т. 1 : Физика.— 2021.— [С. 97-99] |
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| Andere auteurs: | , , |
| Samenvatting: | Заглавие с экрана Atomic force microscopy is a unique technique that allows you to see and measure the surface structure of a sample quickly, with high resolution and accuracy. AFM greatly simplifies the study of the anodic oxide aluminium surface. In this study, we showed how the analysis and processing of images obtained on an atomic force microscope takes place. Methods for obtaining high-quality AFM images using various software were shown. |
| Taal: | Russisch |
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2021
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| Online toegang: | http://earchive.tpu.ru/handle/11683/68350 |
| Formaat: | Elektronisch Hoofdstuk |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=633391 |
| Samenvatting: | Заглавие с экрана Atomic force microscopy is a unique technique that allows you to see and measure the surface structure of a sample quickly, with high resolution and accuracy. AFM greatly simplifies the study of the anodic oxide aluminium surface. In this study, we showed how the analysis and processing of images obtained on an atomic force microscope takes place. Methods for obtaining high-quality AFM images using various software were shown. |
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