К вопросу автоматизированных испытаний силовых коммутационных GaN транзисторов
| Parent link: | Перспективы развития фундаментальных наук=Prospects of Fundamental Sciences Development: сборник научных трудов XIV Международной конференции студентов, аспирантов и молодых ученых, г. Томск, 25-28 апреля 2017 г./ Национальный исследовательский Томский политехнический университет (ТПУ) ; под ред. И. А. Курзиной, Г. А. Вороновой.— , 2017 Т. 7 : IT-технологии и электроника.— 2017.— [С. 111-113] |
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| Other Authors: | , |
| Summary: | Заглавие с экрана This paper discusses automation solution for testing of GaN based power transistors. This solution includes switching circuit that makes it possible to measure representative samples in amounts of ten and more in automatic mode. It enables to reduce efforts and increase measurement repeatability. |
| Language: | Russian |
| Published: |
2017
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| Online Access: | http://earchive.tpu.ru/handle/11683/45347 |
| Format: | Electronic Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=625709 |
| Summary: | Заглавие с экрана This paper discusses automation solution for testing of GaN based power transistors. This solution includes switching circuit that makes it possible to measure representative samples in amounts of ten and more in automatic mode. It enables to reduce efforts and increase measurement repeatability. |
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