PIN-diode diagnostics of pulsed electron beam for high repetition rate mode

PIN-diode diagnostics of pulsed electron beam for high repetition rate mode

Bibliographic Details
Parent link:	Energy Fluxes and Radiation Effects (EFRE-2016): International Congress, October 2–7, 2016, Tomsk, Russia/ National Research Tomsk Polytechnic University (TPU) ; eds. B. M. Kovalchuk [et al.]. [P. 40].— , 2016
Main Author:	Egorov I. S. Ivan Sergeevich
Corporate Author:	Национальный исследовательский Томский политехнический университет (ТПУ) Институт физики высоких технологий (ИФВТ) Лаборатория № 1
Other Authors:	Remnev G. E. Gennady Efimovich, And Xiao Yu
Summary:	Title screen
Language:	English
Published:	2016
Subjects:	труды учёных ТПУ электронный ресурс диоды диагностика импульсные пучки электронные пучки частоты
Online Access:	http://earchive.tpu.ru/handle/11683/33545
Format:	Electronic Book Chapter
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=620967

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