PIN-diode diagnostics of pulsed electron beam for high repetition rate mode

Bibliographic Details
Parent link:Energy Fluxes and Radiation Effects (EFRE-2016): International Congress, October 2–7, 2016, Tomsk, Russia/ National Research Tomsk Polytechnic University (TPU) ; eds. B. M. Kovalchuk [et al.]. [P. 40].— , 2016
Main Author: Egorov I. S. Ivan Sergeevich
Corporate Author: Национальный исследовательский Томский политехнический университет (ТПУ) Институт физики высоких технологий (ИФВТ) Лаборатория № 1
Other Authors: Remnev G. E. Gennady Efimovich, And Xiao Yu
Summary:Title screen
Language:English
Published: 2016
Subjects:
Online Access:http://earchive.tpu.ru/handle/11683/33545
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=620967