Деформационные характеристики приповерхностных слоев циркониевой керамики, имплантированных ионами алюминия
| Parent link: | Перспективы развития фундаментальных наук=Prospects of fundamental sciences development: сборник научных трудов XII Международной конференция студентов и молодых ученых, г. Томск, 21-24 апреля 2015 г./ Национальный исследовательский Томский политехнический университет (ТПУ) ; Национальный исследовательский Томский государственный университет (ТГУ) ; Томский государственный архитектурно-строительный университет (ТГАСУ) ; Томский государственный университет систем управления и радиоэлектроники (ТУСУР) ; ред. кол. И. А. Курзина ; Г. А. Воронова ; С. А. Поробова. [С. 935-937].— , 2015 |
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| Summary: | Заглавие с экрана The effect of ion treatment on the phase composition and mechanical properties of the near-surface layers of zirconium ceramic composition 97 ZrO[2]-3Y[2]O[3] (mol%) was studied. Irradiation of the samples was carried out by accelerated ions of aluminum with using vacuum-arc source Mevva 5-Ru. Ion beam had the following parameters: the energy of the accelerated ions E=78 keV, the pulse current density J[i]=4mA /cm{2}, current pulse duration equal tau=250 mcs, pulse repetition frequency f =5 Hz. Exposure doses (fluence) were 10{16} и 10{17 }ion/cm{2}. The depth distribution implanted ions was studied by SIMS method. It is shown that the maximum projected range of the implanted ions is equal to 250 nm. Near-surface layers were investigated by X-ray diffraction (XRD) at fixed grazing incidence angle. It is shown that implantation of aluminum ions into the ceramics does not lead to a change in the phase composition of the near-surface layer. The influence of implanted ions on mechanical properties of ceramic near-surface layers was studied by the method of dynamic nanoindentation using small loads on the indenter P=300 mN. It is shown that in ion-implanted ceramic layer the processes of material recovery in the deformed region in the unloading mode proceeds with higher efficiency as compared with the initial material state. The deformation characteristics of samples before and after ion treatment have been determined from interpretation of the resulting Р-h curves within the loading and unloading sections by the technique proposed by Oliver and Pharr. It was found that implantation of aluminum ions in the near-surface layer of zirconia ceramics increases nanohardness and reduces the Young's modulus. |
| Language: | Russian |
| Published: |
2015
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| Series: | Технологии и электроника |
| Subjects: | |
| Online Access: | http://earchive.tpu.ru/handle/11683/19046 http://www.lib.tpu.ru/fulltext/c/2015/C21/297.pdf |
| Format: | Electronic Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=613124 |
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| 200 | 1 | |a Деформационные характеристики приповерхностных слоев циркониевой керамики, имплантированных ионами алюминия |d Deformation characteristics of the near-surface layers of zirconia ceramics implanted with ions of aluminum |f И. П. Васильев, С. А. Гынгазов, А. В. Чернявский |g науч. рук. А. П. Суржиков | |
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| 330 | |a The effect of ion treatment on the phase composition and mechanical properties of the near-surface layers of zirconium ceramic composition 97 ZrO[2]-3Y[2]O[3] (mol%) was studied. Irradiation of the samples was carried out by accelerated ions of aluminum with using vacuum-arc source Mevva 5-Ru. Ion beam had the following parameters: the energy of the accelerated ions E=78 keV, the pulse current density J[i]=4mA /cm{2}, current pulse duration equal tau=250 mcs, pulse repetition frequency f =5 Hz. Exposure doses (fluence) were 10{16} и 10{17 }ion/cm{2}. The depth distribution implanted ions was studied by SIMS method. It is shown that the maximum projected range of the implanted ions is equal to 250 nm. Near-surface layers were investigated by X-ray diffraction (XRD) at fixed grazing incidence angle. It is shown that implantation of aluminum ions into the ceramics does not lead to a change in the phase composition of the near-surface layer. The influence of implanted ions on mechanical properties of ceramic near-surface layers was studied by the method of dynamic nanoindentation using small loads on the indenter P=300 mN. It is shown that in ion-implanted ceramic layer the processes of material recovery in the deformed region in the unloading mode proceeds with higher efficiency as compared with the initial material state. The deformation characteristics of samples before and after ion treatment have been determined from interpretation of the resulting Р-h curves within the loading and unloading sections by the technique proposed by Oliver and Pharr. It was found that implantation of aluminum ions in the near-surface layer of zirconia ceramics increases nanohardness and reduces the Young's modulus. | ||
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| 463 | 1 | |0 (RuTPU)RU\TPU\conf\10376 |t Перспективы развития фундаментальных наук |l Prospects of fundamental sciences development |o сборник научных трудов XII Международной конференция студентов и молодых ученых, г. Томск, 21-24 апреля 2015 г. |f Национальный исследовательский Томский политехнический университет (ТПУ) ; Национальный исследовательский Томский государственный университет (ТГУ) ; Томский государственный архитектурно-строительный университет (ТГАСУ) ; Томский государственный университет систем управления и радиоэлектроники (ТУСУР) ; ред. кол. И. А. Курзина ; Г. А. Воронова ; С. А. Поробова |v [С. 935-937] |d 2015 | |
| 510 | 1 | |a Deformation characteristics of the near-surface layers of zirconia ceramics implanted with ions of aluminum |z eng | |
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a деформационные характеристики | |
| 610 | 1 | |a приповерхностные слои | |
| 610 | 1 | |a циркониевая керамика | |
| 610 | 1 | |a ионы алюминия | |
| 700 | 1 | |a Васильев |b И. П. |c специалист в области электротехники |c лаборант-исследователь Томского политехнического университета |f 1990- |g Иван Петрович |3 (RuTPU)RU\TPU\pers\30664 |9 14945 | |
| 701 | 1 | |a Гынгазов |b С. А. |c специалист в области электроники |c профессор Томского политехнического университета, доктор технических наук |f 1958- |g Сергей Анатольевич |3 (RuTPU)RU\TPU\pers\26531 |9 12225 | |
| 701 | 1 | |a Чернявский |b А. В. |c специалист в области электроники |c старший научный сотрудник Томского политехнического университета, кандидат физико-математических наук |f 1966- |g Александр Викторович |3 (RuTPU)RU\TPU\pers\26556 | |
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