Влияние водорода и кислорода на электропроводность меди; Перспективы развития фундаментальных наук
| Parent link: | Перспективы развития фундаментальных наук.— 2015.— [С. 314-316] |
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| 第一著者: | |
| 団体著者: | |
| その他の著者: | , |
| 要約: | Заглавие с экрана Investigated the variation of the electrical DC and eddy current (magnetic spectrometer (ACI)). Copper structure essentially depends on the production method of copper. For example, a composite material consisting of a matrix of copper and copper oxide particles. For the analysis ofcopperuse differentmethods of control. The electrical conductivityissusceptibility parameteron the structure. Measurement of the propertiesof coppereddy currentswhenrestructuringhas advantages. In this work,the conductivity measurementis comparedwith acopper X-raystudies, with its microhardnessdefect densitycalculationswithcopper, whichis madeof oxygenand hydrogen. This provides informationaboutchanges in the structureof coppereddy currentmeasurements.It is shown that the amount of active, reactive component and the phase relationship of the eddy currents greatly depends on the position of grains, pores and other defects, which allows the use of eddy for line control products, used in traditional methods of control hard to reach places. Information about the scattering power of defect scattering mechanism at different depths samples obtained through the use of currents of different frequencies. The values of the eddy currents depends on the amount of copper vacancies high-angle grain boundaries, dislocations, and low-angle and high angle boundaries. Change in the electrical conductivity of copper containing oxygen and hydrogen is compared with its structure. Studiesof X-ray, microhardness, calculate the densityof defects, compared with thechange in the structureof copperon measurementsof eddy currents. All measurementsare comparedby MSA with other methods: optical Olympus GX-71 and REM-125K electronmicroscopes, X-ray(diffractometer Shimadzu XRD-7000S)spectra of GD-Profiler. Highlight specificinfluenceof some elements(N, O, Het al.) Such comparisonsare possible, since the eddy currentpenetration depthis a function offrequency. In this paperare examples of defectsas pores, copper oxidesasinclusionsin thestructure. |
| 言語: | ロシア語 |
| 出版事項: |
2015
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| シリーズ: | Физика |
| 主題: | |
| オンライン･アクセス: | http://earchive.tpu.ru/handle/11683/19173 http://www.lib.tpu.ru/fulltext/c/2015/C21/094.pdf |
| フォーマット: | 電子媒体 図書の章 |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=613005 |
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| 200 | 1 | |a Влияние водорода и кислорода на электропроводность меди |d Effect of hydrogen and oxigene on conductivity of cooper |f Ши Кунь, Сюй Шупэн, В. В. Ларионов |g науч. рук. В. В. Ларионов | |
| 203 | |a Текст |c электронный | ||
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| 300 | |a Заглавие с экрана | ||
| 320 | |a [Библиогр.: с. 316 (6 назв.)] | ||
| 330 | |a Investigated the variation of the electrical DC and eddy current (magnetic spectrometer (ACI)). Copper structure essentially depends on the production method of copper. For example, a composite material consisting of a matrix of copper and copper oxide particles. For the analysis ofcopperuse differentmethods of control. The electrical conductivityissusceptibility parameteron the structure. Measurement of the propertiesof coppereddy currentswhenrestructuringhas advantages. In this work,the conductivity measurementis comparedwith acopper X-raystudies, with its microhardnessdefect densitycalculationswithcopper, whichis madeof oxygenand hydrogen. This provides informationaboutchanges in the structureof coppereddy currentmeasurements.It is shown that the amount of active, reactive component and the phase relationship of the eddy currents greatly depends on the position of grains, pores and other defects, which allows the use of eddy for line control products, used in traditional methods of control hard to reach places. Information about the scattering power of defect scattering mechanism at different depths samples obtained through the use of currents of different frequencies. The values of the eddy currents depends on the amount of copper vacancies high-angle grain boundaries, dislocations, and low-angle and high angle boundaries. | ||
| 330 | |a Change in the electrical conductivity of copper containing oxygen and hydrogen is compared with its structure. Studiesof X-ray, microhardness, calculate the densityof defects, compared with thechange in the structureof copperon measurementsof eddy currents. All measurementsare comparedby MSA with other methods: optical Olympus GX-71 and REM-125K electronmicroscopes, X-ray(diffractometer Shimadzu XRD-7000S)spectra of GD-Profiler. Highlight specificinfluenceof some elements(N, O, Het al.) Such comparisonsare possible, since the eddy currentpenetration depthis a function offrequency. In this paperare examples of defectsas pores, copper oxidesasinclusionsin thestructure. | ||
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| 463 | 1 | |0 (RuTPU)RU\TPU\conf\10376 |t Перспективы развития фундаментальных наук |l Prospects of fundamental sciences development |o сборник научных трудов XII Международной конференция студентов и молодых ученых, г. Томск, 21-24 апреля 2015 г. |f Национальный исследовательский Томский политехнический университет (ТПУ) ; Национальный исследовательский Томский государственный университет (ТГУ) ; Томский государственный архитектурно-строительный университет (ТГАСУ) ; Томский государственный университет систем управления и радиоэлектроники (ТУСУР) ; ред. кол. И. А. Курзина ; Г. А. Воронова ; С. А. Поробова |v [С. 314-316] |d 2015 | |
| 510 | 1 | |a Effect of hydrogen and oxigene on conductivity of cooper |z eng | |
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a водород | |
| 610 | 1 | |a кислород | |
| 610 | 1 | |a электропроводность | |
| 610 | 1 | |a медь | |
| 700 | 0 | |a Ши Кунь | |
| 701 | 0 | |a Сюй Шупэн |c физик |c инженер Томского политехнического университета |f 1993- |3 (RuTPU)RU\TPU\pers\46318 | |
| 701 | 1 | |a Ларионов |b В. В. |c физик |c профессор Томского политехнического университета, доктор педагогических наук |f 1945- |g Виталий Васильевич |3 (RuTPU)RU\TPU\pers\25193 |9 11273 | |
| 702 | 1 | |a Ларионов |b В. В. |c физик |c профессор Томского политехнического университета, доктор педагогических наук |f 1945- |g Виталий Васильевич |4 727 | |
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