Измерение магнитной индукции в А-К зазоре диода с магнитной самоизоляцией; Перспективы развития фундаментальных наук

Détails bibliographiques
Parent link:Перспективы развития фундаментальных наук.— 2015.— [С. 54-56]
Auteur principal: Аширбаев М. Е.
Collectivité auteur: Национальный исследовательский Томский политехнический университет (ТПУ) Институт физики высоких технологий (ИФВТ) Кафедра техники и электрофизики высоких напряжений (ТЭВН)
Autres auteurs: Пушкарев А. И. Александр Иванович (научный руководитель)
Résumé:Заглавие с экрана
This research presents the results of the magnetic field in the A-K gap ion diode with magnetic selfisolation. The studies were performed on the accelerator TEMP-4M, which consists of capacitive storage - voltage impulse generator, double forming line and a diode with magnetic self-insulation. We found there was a discrepancy with the results between the experimental values of the magnetic induction (calculated from sensor readings) and the the simulation program ELCUT may be due to the contribution of electromagnetic interference generated during operation of the ion diode with magnetic self-insulation of electrons.
Langue:russe
Publié: 2015
Collection:Физика
Sujets:
Accès en ligne:http://earchive.tpu.ru/handle/11683/19178
http://www.lib.tpu.ru/fulltext/c/2015/C21/009.pdf
Format: Électronique Chapitre de livre
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=612922
Description
Description matérielle:1 файл(196 Кб)
Résumé:Заглавие с экрана
This research presents the results of the magnetic field in the A-K gap ion diode with magnetic selfisolation. The studies were performed on the accelerator TEMP-4M, which consists of capacitive storage - voltage impulse generator, double forming line and a diode with magnetic self-insulation. We found there was a discrepancy with the results between the experimental values of the magnetic induction (calculated from sensor readings) and the the simulation program ELCUT may be due to the contribution of electromagnetic interference generated during operation of the ion diode with magnetic self-insulation of electrons.