ИК-спектроскопия как метод определения спектров поглощения покрытий на основе кремнийзамещенного гидроксиапатита; Перспективы развития фундаментальных наук
| Parent link: | Перспективы развития фундаментальных наук.— 2013.— [С. 879-881] |
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| Muut tekijät: | , , |
| Yhteenveto: | Заглавие с экрана Silicon-substituted hydroxyapatite coatings have been prepared by radio-frequency magnetron sputtering. The deposition rate of the deposited coatings was controlled by changing the bias voltage from grounded (0 V) to -100 V. In this work was considered the results of Infrared Fourier Transform Spectroscopy (FTIR) in details. The silicon enters into the apatite structure in the form of SiO44-groups that partially substitute the PO43-groups. The spectral modes which are characteristic for hydroxyapatite were observed by FTIR spectroscopy and presence of the silicon in the crystal lattice of hydroxyapatite was confirmed. Moreover, the peaks of the carbonate groups were identified. |
| Kieli: | venäjä |
| Julkaistu: |
2013
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| Sarja: | Наноматериалы и нанотехнологии |
| Aiheet: | |
| Linkit: | http://www.lib.tpu.ru/fulltext/c/2013/C21/301.pdf |
| Aineistotyyppi: | Elektroninen Kirjan osa |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=603950 |