ИК-спектроскопия как метод определения спектров поглощения покрытий на основе кремнийзамещенного гидроксиапатита; Перспективы развития фундаментальных наук

ИК-спектроскопия как метод определения спектров поглощения покрытий на основе кремнийзамещенного гидроксиапатита; Перспективы развития фундаментальных наук

Bibliographic Details
Parent link:Перспективы развития фундаментальных наук.— 2013.— [С. 879-881]
Main Author: Городжа С. Н. Светлана Николаевна
Corporate Author: Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра теоретической и экспериментальной физики (ТиЭФ)
Other Authors: Сурменева М. А. Мария Александровна (научный руководитель), Пустовалова А. А. Алла Александровна, Сурменев Р. А. Роман Анатольевич
Summary:Заглавие с экрана
Silicon-substituted hydroxyapatite coatings have been prepared by radio-frequency magnetron sputtering. The deposition rate of the deposited coatings was controlled by changing the bias voltage from grounded (0 V) to -100 V. In this work was considered the results of Infrared Fourier Transform Spectroscopy (FTIR) in details. The silicon enters into the apatite structure in the form of SiO44-groups that partially substitute the PO43-groups. The spectral modes which are characteristic for hydroxyapatite were observed by FTIR spectroscopy and presence of the silicon in the crystal lattice of hydroxyapatite was confirmed. Moreover, the peaks of the carbonate groups were identified.
Language:Russian
Published: 2013
Series:Наноматериалы и нанотехнологии
Subjects:
электронный ресурс
труды учёных ТПУ
ИК-спектры
поглощенные основания
покрытия
кремнийорганические материалы
гидроксиапатит
Online Access:http://www.lib.tpu.ru/fulltext/c/2013/C21/301.pdf
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=603950
Description
Physical Description:1 файл(387 Кб)
Summary:Заглавие с экрана
Silicon-substituted hydroxyapatite coatings have been prepared by radio-frequency magnetron sputtering. The deposition rate of the deposited coatings was controlled by changing the bias voltage from grounded (0 V) to -100 V. In this work was considered the results of Infrared Fourier Transform Spectroscopy (FTIR) in details. The silicon enters into the apatite structure in the form of SiO44-groups that partially substitute the PO43-groups. The spectral modes which are characteristic for hydroxyapatite were observed by FTIR spectroscopy and presence of the silicon in the crystal lattice of hydroxyapatite was confirmed. Moreover, the peaks of the carbonate groups were identified.

Similar Items