Изучение столкновительного распыления металлов в широком диапазоне начальных энергий падающих ионов

Bibliographische Detailangaben
Parent link:Перспективы развития фундаментальных наук.— 2013.— [С. 174-176]
1. Verfasser: Рябкина К. С.
Körperschaft: Национальный исследовательский Томский политехнический университет
Weitere Verfasser: Степанова О. М. Ольга Михайловна (научный руководитель)
Zusammenfassung:Заглавие с экрана
The present work is devoted to investigation of collisional sputtering of metals under accelerated ions of initial energies from 10-2 to 103 keV. Sputtering yields are calculated by means of Sigmund theory expressions. Dependences of sputtering yield on ion initial energy, atomic number, and sublimation energy of a target material and ion incidence angle are studied. Maximum sputtering yield conditions are defined in the case of Ar+ and Xe+ ions. Sputtering yield is apt to grow for materials with sublimation energy of 1.5-2.4 eV. Materials with high melting temperature have lower sputtering yield. The sputtering yield maximum is observed at an ion incidence angle of 65-75°.
Sprache:Russisch
Veröffentlicht: 2013
Schriftenreihe:Физика
Schlagworte:
Online-Zugang:http://www.lib.tpu.ru/fulltext/c/2013/C21/055.pdf
Format: Elektronisch Buchkapitel
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=603625
Beschreibung
Beschreibung:1 файл(621 Кб)
Zusammenfassung:Заглавие с экрана
The present work is devoted to investigation of collisional sputtering of metals under accelerated ions of initial energies from 10-2 to 103 keV. Sputtering yields are calculated by means of Sigmund theory expressions. Dependences of sputtering yield on ion initial energy, atomic number, and sublimation energy of a target material and ion incidence angle are studied. Maximum sputtering yield conditions are defined in the case of Ar+ and Xe+ ions. Sputtering yield is apt to grow for materials with sublimation energy of 1.5-2.4 eV. Materials with high melting temperature have lower sputtering yield. The sputtering yield maximum is observed at an ion incidence angle of 65-75°.