Vavilov V. P. Vladimir Platonovich, Storozhenko V. A., & Ivanishina Z. V. (1984). Effect of the size of the scanning spot and the frequency characteristics of the photoreceiver on the sensitivity of active thermal testing; The Soviet journal of nondestructive testing; Vol. 20, iss. 4. 1984.
Chicago-viite (17. p.)Vavilov V. P. Vladimir Platonovich, Storozhenko V. A., ja Ivanishina Z. V. Effect of the Size of the Scanning Spot and the Frequency Characteristics of the Photoreceiver on the Sensitivity of Active Thermal Testing; The Soviet Journal of Nondestructive Testing; Vol. 20, Iss. 4. 1984, 1984.
MLA-viite (9. p.)Vavilov V. P. Vladimir Platonovich, et al. Effect of the Size of the Scanning Spot and the Frequency Characteristics of the Photoreceiver on the Sensitivity of Active Thermal Testing; The Soviet Journal of Nondestructive Testing; Vol. 20, Iss. 4. 1984, 1984.