Vavilov V. P. Vladimir Platonovich, Storozhenko V. A., & Ivanishina Z. V. (1984). Effect of the size of the scanning spot and the frequency characteristics of the photoreceiver on the sensitivity of active thermal testing. 1984.
Chicago Style (17th ed.) CitationVavilov V. P. Vladimir Platonovich, Storozhenko V. A., and Ivanishina Z. V. Effect of the Size of the Scanning Spot and the Frequency Characteristics of the Photoreceiver on the Sensitivity of Active Thermal Testing. 1984, 1984.
MLA (9th ed.) CitationVavilov V. P. Vladimir Platonovich, et al. Effect of the Size of the Scanning Spot and the Frequency Characteristics of the Photoreceiver on the Sensitivity of Active Thermal Testing. 1984, 1984.
Warning: These citations may not always be 100% accurate.