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|a 600855
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|a 20140716d1995 k||y0rusy50 ba
|
| 101 |
0 |
|
|a eng
|
| 102 |
|
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|a RU
|
| 200 |
1 |
|
|a Investigations of the Noise Performances of the FET AP354G at Low Temperature
|d Исследование шумовых характеристик транзисторов АП354Г при низких температурах
|f S. V. Uchaykin (Uchaikin)
|
| 320 |
|
|
|a References: p. 30 (3 tit.)
|
| 333 |
|
|
|a В фонде НТБ ТПУ отсутствует
|
| 461 |
|
|
|t Краткие сообщения в ОИЯИ
|l JINR Rapid Communications
|d 1984-1999
|
| 463 |
|
|
|t № 4 (72)
|v P. 25-30
|d 1995
|
| 610 |
1 |
|
|a труды учёных ТПУ
|
| 700 |
|
1 |
|a Uchaykin (Uchaikin)
|b S. V.
|c specialist in the field of non-destructive testing
|c Engineer of Tomsk Polytechnic University, Doctor of physical and mathematical sciences
|f 1963-
|g Sergey Victorovich
|3 (RuTPU)RU\TPU\pers\32279
|
| 801 |
|
1 |
|a RU
|b 63413507
|c 20140627
|
| 801 |
|
2 |
|a RU
|b 63413507
|c 20140716
|g RCR
|
| 942 |
|
|
|c CR
|
