Investigation of the Characteristics of CMOS ICs at Low Temperatures

গ্রন্থ-পঞ্জীর বিবরন
Parent link:Instruments and Experimental Techniques: journal.— , 1958-
Vol. 40, № 4.— 1997.— P. 581-584
প্রধান লেখক: Uchaykin (Uchaikin) S. V. Sergey Victorovich
সংক্ষিপ্ত:Certain types of complementary metal–oxide–semiconductor (CMOS) and high-speed comple-mentary metal–oxide–semiconductor (HCMOS) integrated circuits (ICs) were investigated at temperatures T from 1.4 to 297 K. Basic parameters of integrated multiplexers operating at liquid helium temperature were measured. Integrated circuits of the frame01564 and 74HC family fabricated by HCMOS technology exhibited the best characteristics at T = 4.2 K.
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ভাষা:ইংরেজি
প্রকাশিত: 1997
বিষয়গুলি:
বিন্যাস: গ্রন্থের অধ্যায়
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=600848

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