Measurements of Thickness Dependence of Parametric X-Radiation from Si: preprint Hiroshima University HUPD-9319

Measurements of Thickness Dependence of Parametric X-Radiation from Si: preprint Hiroshima University HUPD-9319

Bibliographic Details
Corporate Author: Hiroshima University
Other Authors: Endo I., Harada M., Kobayashi T., Lee Y. S., Takahashi T., Muto M., Yoshida K., Nitta H., Potylitsyn A. P. Alexander Petrovich, Zabaev V. N. Viktor Nikolaevich
Summary:В фонде НТБ ТПУ отсутствует
Language:English
Published: Hiroshima, 1993
Subjects:
труды учёных ТПУ
препринты
Format: Book
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=600418
Description
Physical Description:15 p.
Summary:В фонде НТБ ТПУ отсутствует

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