Hiroshima University, Endo I, Harada M, Kobayashi T, Lee Y. S., Takahashi T, . . . Zabaev V. N. Viktor Nikolaevich. (1993). Measurements of Thickness Dependence of Parametric X-Radiation from Si: Preprint Hiroshima University HUPD-9319. Hiroshima, 1993.
Chicago Style (17th ed.) CitationHiroshima University, et al. Measurements of Thickness Dependence of Parametric X-Radiation from Si: Preprint Hiroshima University HUPD-9319. Hiroshima, 1993, 1993.
MLA (9th ed.) CitationHiroshima University, et al. Measurements of Thickness Dependence of Parametric X-Radiation from Si: Preprint Hiroshima University HUPD-9319. Hiroshima, 1993, 1993.
Warning: These citations may not always be 100% accurate.