Flaw-detection characteristics of the compact MIB-4 betatron; Soviet Journal of Nondestructive Testing; Vol. 23, iss. 1

Flaw-detection characteristics of the compact MIB-4 betatron; Soviet Journal of Nondestructive Testing; Vol. 23, iss. 1

Библиографические подробности
Источник:	Soviet Journal of Nondestructive Testing.— , 1965- Vol. 23, iss. 1.— 1987.— P. 21-25
Главный автор:	Boiko D. A.
Другие авторы:	Filimonov A. A. Anatoly Alekseevich, Chakhlov V. L. Vladimir Lukianovich
Примечания:	Translated from Defektoskopiya; 23: No. 1, 27-31 (Jan 1986) Information which refines and complements the method of inspecting parts by means of the MIB-4 device is provided. The results obtained in testing this equipment abroad are given. В фонде НТБ ТПУ отсутствует
Язык:	английский
Опубликовано:	1987
Предметы:	труды учёных ТПУ
Формат:	Статья
Запись в KOHA:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=599789

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