Flaw-detection characteristics of the compact MIB-4 betatron; Soviet Journal of Nondestructive Testing; Vol. 23, iss. 1

Bibliografiska uppgifter
Parent link:Soviet Journal of Nondestructive Testing.— , 1965-
Vol. 23, iss. 1.— 1987.— P. 21-25
Huvudupphovsman: Boiko D. A.
Övriga upphovsmän: Filimonov A. A. Anatoly Alekseevich, Chakhlov V. L. Vladimir Lukianovich
Sammanfattning:Translated from Defektoskopiya; 23: No. 1, 27-31 (Jan 1986)
Information which refines and complements the method of inspecting parts by means of the MIB-4 device is provided. The results obtained in testing this equipment abroad are given.
В фонде НТБ ТПУ отсутствует
Språk:engelska
Publicerad: 1987
Ämnen:
Materialtyp: Bokavsnitt
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=599789

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