Flaw-detection characteristics of the compact MIB-4 betatron; Soviet Journal of Nondestructive Testing; Vol. 23, iss. 1

Détails bibliographiques
Parent link:Soviet Journal of Nondestructive Testing.— , 1965-
Vol. 23, iss. 1.— 1987.— P. 21-25
Auteur principal: Boiko D. A.
Autres auteurs: Filimonov A. A. Anatoly Alekseevich, Chakhlov V. L. Vladimir Lukianovich
Résumé:Translated from Defektoskopiya; 23: No. 1, 27-31 (Jan 1986)
Information which refines and complements the method of inspecting parts by means of the MIB-4 device is provided. The results obtained in testing this equipment abroad are given.
В фонде НТБ ТПУ отсутствует
Langue:anglais
Publié: 1987
Sujets:
Format: Chapitre de livre
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=599789

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300 |a Translated from Defektoskopiya; 23: No. 1, 27-31 (Jan 1986) 
330 |a Information which refines and complements the method of inspecting parts by means of the MIB-4 device is provided. The results obtained in testing this equipment abroad are given. 
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701 1 |a Filimonov  |b A. A.  |c specialist in the field of non-destructive testing  |c Senior researcher of Tomsk Polytechnic University, Candidate of technical sciences  |f 1938-  |g Anatoly Alekseevich  |3 (RuTPU)RU\TPU\pers\32271 
701 1 |a Chakhlov  |b V. L.  |c physicist  |c Honored worker of science and technology of the Russian Federation  |c Honored Professor of Tomsk Polytechnic University, Doctor ofTechnical Sciences (DSc)  |f 1934-2011  |g Vladimir Lukianovich  |3 (RuTPU)RU\TPU\pers\30042  |4 070 
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