Flaw-detection characteristics of the compact MIB-4 betatron; Soviet Journal of Nondestructive Testing; Vol. 23, iss. 1
| Parent link: | Soviet Journal of Nondestructive Testing.— , 1965- Vol. 23, iss. 1.— 1987.— P. 21-25 |
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| Päätekijä: | |
| Muut tekijät: | , |
| Yhteenveto: | Translated from Defektoskopiya; 23: No. 1, 27-31 (Jan 1986) Information which refines and complements the method of inspecting parts by means of the MIB-4 device is provided. The results obtained in testing this equipment abroad are given. В фонде НТБ ТПУ отсутствует |
| Kieli: | englanti |
| Julkaistu: |
1987
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| Aiheet: | |
| Aineistotyyppi: | Kirjan osa |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=599789 |
| Yhteenveto: | Translated from Defektoskopiya; 23: No. 1, 27-31 (Jan 1986) Information which refines and complements the method of inspecting parts by means of the MIB-4 device is provided. The results obtained in testing this equipment abroad are given. В фонде НТБ ТПУ отсутствует |
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