Electrical properties of mim structures based on vanadium-borate glass; Soviet Physics Journal; Vol. 24, № 3
| Parent link: | Soviet Physics Journal.— , 1965-1992 Vol. 24, № 3.— 1981.— P. 262-266 |
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| Άλλοι συγγραφείς: | , , , , |
| Περίληψη: | The results are given of investigation of the dc and ac electrical properties of thin-film metal-insulator-metal structures of capacitor type based on glass of the composition 35% B2O3-15% CaO-20% V2O4-30% V2O5 (wt.%). The glass films were deposited by an explosive method on a glassceramic substrate at t°=80°C. Upper and lower Nichrome electrodes were obtained by thermal evaporation. The influence of annealing on the conductivity and current-voltage characteristics of such structures was investigated. It was found that the current-voltage characteristics before and after annealing are determined in a wide range of temperatures and constant electric fields by contact barriers on the metal-glass-film interface. The ac behavior of the samples at f >102 Hz is due to the bulk properties of the glass film В фонде НТБ ТПУ отсутствует |
| Γλώσσα: | Αγγλικά |
| Έκδοση: |
1981
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| Θέματα: | |
| Μορφή: | Κεφάλαιο βιβλίου |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=599529 |
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| 101 | 0 | |a eng | |
| 102 | |a US | ||
| 200 | 1 | |a Electrical properties of mim structures based on vanadium-borate glass |f V. M. Kalygina [et. el.] | |
| 320 | |a References: p. 265-266 (15 tit.) | ||
| 330 | |a The results are given of investigation of the dc and ac electrical properties of thin-film metal-insulator-metal structures of capacitor type based on glass of the composition 35% B2O3-15% CaO-20% V2O4-30% V2O5 (wt.%). The glass films were deposited by an explosive method on a glassceramic substrate at t°=80°C. Upper and lower Nichrome electrodes were obtained by thermal evaporation. The influence of annealing on the conductivity and current-voltage characteristics of such structures was investigated. It was found that the current-voltage characteristics before and after annealing are determined in a wide range of temperatures and constant electric fields by contact barriers on the metal-glass-film interface. The ac behavior of the samples at f >102 Hz is due to the bulk properties of the glass film | ||
| 333 | |a В фонде НТБ ТПУ отсутствует | ||
| 461 | |t Soviet Physics Journal |d 1965-1992 | ||
| 463 | |t Vol. 24, № 3 |v P. 262-266 |d 1981 | ||
| 610 | 1 | |a труды учёных ТПУ | |
| 701 | 1 | |a Kalygina |b V. M. | |
| 701 | 1 | |a Kosintsev |b V. I. |c Chemical Engineer |c consulting professor, Doctor of technical sciences |f 1939- |g Victor Ivanovich |3 (RuTPU)RU\TPU\pers\31066 | |
| 701 | 1 | |a Gaman |b V. I. | |
| 701 | 1 | |a Modebadze |b O. E. | |
| 701 | 1 | |a Nikolaev |b A. I. | |
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