Positron profiles and positron annihilation in thin layers; Physica status solidi (a); Vol. 71, Iss. 1

Positron profiles and positron annihilation in thin layers

書誌詳細
Parent link:	Physica status solidi (a).— , 1961- Vol. 71, Iss. 1.— 1982.— P. 145-151
第一著者:	Pogrernyak A. D.
その他の著者:	Kuzminikh V. A., Arefyev (Afef'ev, Arefiev) K. P. Konstantin Petrovich
要約:	The moderated positron density distribution over the sample depth is properly calculated. The results obtained are used as the basis for the positron annihilation probability in thin foils and surface layers. The annihilation photon angular distribution (APAD) for the double-layer samples is measured. Using the results obtained the minimum foil thickness of materials of various effective atomic numbers on the semiconductor GaAs support is determined. Their structure can be studied by the positron-spectroscopy method with the 22Na(ß+, γ) emitter. В фонде НТБ ТПУ отсутствует
言語:	英語
出版事項:	1982
主題:	труды учёных ТПУ
フォーマット:	図書の章
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=598296

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