Scaling effects in structural-phase self-organization at the "thin film - substrate" interface; Physical Mesomechanics; Vol. 10, iss. 3-4, May-Aug.

Scaling effects in structural-phase self-organization at the "thin film - substrate" interface; Physical Mesomechanics; Vol. 10, iss. 3-4, May-Aug.

Бібліографічні деталі
Parent link:	Physical Mesomechanics.— .— Amsterdam: Elsevier Science Publishing Company Inc. Vol. 10, iss. 3-4, May-Aug..— 2007.— P. 117-128
Інші автори:	Panin V. E. Viktor Evgenyevich, Panin A. V. Alexey Viktorovich, Sergeev V. P. Viktor Petrovich, Shugurov A. R. Artur Rubinovich
Резюме:	The paper demonstrates that at the "thin film - substrate" interface there occurs structural self-organization that reveals two levels of structural-phase scaling. The levels are governed by the formation of cluster and cellular mesostructures. We discuss the nature of structural-phase self-organization, the commonness of the obtained results and their importance for scientific and engineering applications Текстовый файл AM_Agreement
Мова:	Англійська
Опубліковано:	2007
Предмети:	труды учёных ТПУ электронный ресурс
Онлайн доступ:	https://doi.org/10.1016/j.physme.2007.08.001
Формат:	Електронний ресурс Частина з книги
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=597649

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