Small-size betatrons for flaw detection; Proceedings of the 3rd International Symposium on Test and Measurement, ISTM-99, Xi'an, China, 2-4 June, 1999

Small-size betatrons for flaw detection; Proceedings of the 3rd International Symposium on Test and Measurement, ISTM-99, Xi'an, China, 2-4 June, 1999

Manylion Llyfryddiaeth
Parent link:	Proceedings of the 3rd International Symposium on Test and Measurement, ISTM-99, Xi'an, China, 2-4 June, 1999.— 1999.— P. 791-793
Prif Awdur:	Chakhlov V. L. Vladimir Lukianovich
Awduron Eraill:	Shtein M. M. Mikhail Mikhailovich, Kas'yanov V. A.
Crynodeb:	The Introscopy Institute of Tomsk Polytechnical University (SRII of TPU) is a large institution established with the goal of developing and designing nondestructive testing (NDT) systems for industrial application. The traditional direction in this field is related to the fabrication of mobile NDT systems using small-size betatrons. Up to the present, SRII continues to produce small-size betatrons with a maximum energy from 4 to 10 MeV. В фонде НТБ ТПУ отсутствует
Iaith:	Saesneg
Cyhoeddwyd:	1999
Pynciau:	труды учёных ТПУ
Fformat:	Pennod Llyfr
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=595894

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