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| LEADER |
00000naa0a2200000 4500 |
| 001 |
595894 |
| 005 |
20250618091154.0 |
| 035 |
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|a (RuTPU)RU\TPU\tpu\17778
|
| 035 |
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|a RU\TPU\tpu\16893
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| 090 |
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|a 595894
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| 100 |
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|a 20100701d1999 k||y0rusy50 ba
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| 101 |
0 |
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|a eng
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| 102 |
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|a CN
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| 200 |
1 |
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|a Small-size betatrons for flaw detection
|f V. L. Chakhlov, M. M. Shtein, V. A. Kas'yanov
|
| 330 |
|
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|a The Introscopy Institute of Tomsk Polytechnical University (SRII of TPU) is a large institution established with the goal of developing and designing nondestructive testing (NDT) systems for industrial application. The traditional direction in this field is related to the fabrication of mobile NDT systems using small-size betatrons. Up to the present, SRII continues to produce small-size betatrons with a maximum energy from 4 to 10 MeV.
|
| 333 |
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|a В фонде НТБ ТПУ отсутствует
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| 463 |
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|t Proceedings of the 3rd International Symposium on Test and Measurement, ISTM-99, Xi'an, China, 2-4 June, 1999
|v P. 791-793
|d 1999
|
| 610 |
1 |
|
|a труды учёных ТПУ
|
| 700 |
|
1 |
|a Chakhlov
|b V. L.
|c physicist
|c Honored worker of science and technology of the Russian Federation
|c Honored Professor of Tomsk Polytechnic University, Doctor ofTechnical Sciences (DSc)
|f 1934-2011
|g Vladimir Lukianovich
|3 (RuTPU)RU\TPU\pers\30042
|
| 701 |
|
1 |
|a Shtein
|b M. M.
|c Physicist
|c Head of Laboratory at Tomsk Polytechnic University, Candidate of technical sciences
|f 1938-
|g Mikhail Mikhailovich
|3 (RuTPU)RU\TPU\pers\31482
|4 070
|
| 701 |
|
1 |
|a Kas'yanov
|b V. A.
|
| 801 |
|
1 |
|a RU
|b 63413507
|c 20091207
|
| 801 |
|
2 |
|a RU
|b 63413507
|c 20131119
|g RCR
|
| 850 |
|
|
|a 63413507
|
| 942 |
|
|
|c BK
|
