Small-size betatrons for flaw detection
| Parent link: | Proceedings of the 3rd International Symposium on Test and Measurement, ISTM-99, Xi'an, China, 2-4 June, 1999. P. 791-793.— , 1999 |
|---|---|
| Autor principal: | |
| Outros Autores: | , |
| Resumo: | The Introscopy Institute of Tomsk Polytechnical University (SRII of TPU) is a large institution established with the goal of developing and designing nondestructive testing (NDT) systems for industrial application. The traditional direction in this field is related to the fabrication of mobile NDT systems using small-size betatrons. Up to the present, SRII continues to produce small-size betatrons with a maximum energy from 4 to 10 MeV. В фонде НТБ ТПУ отсутствует |
| Publicado em: |
1999
|
| Assuntos: | |
| Formato: | Capítulo de Livro |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=595894 |
| Resumo: | The Introscopy Institute of Tomsk Polytechnical University (SRII of TPU) is a large institution established with the goal of developing and designing nondestructive testing (NDT) systems for industrial application. The traditional direction in this field is related to the fabrication of mobile NDT systems using small-size betatrons. Up to the present, SRII continues to produce small-size betatrons with a maximum energy from 4 to 10 MeV. В фонде НТБ ТПУ отсутствует |
|---|