A complex of spectrochemical, mass-spectrometric and atomic-absorption methods for the analysis of thin layers of gallium arsenide and silicon semiconductors [offprint]
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| Jezik: | angleščina |
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Vienna, Springer-Verlag, 1978
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| Serija: | Mikrochimica Acta № 1, 1978 |
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| Format: | Knjiga |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=335673 |