Detaylı Bibliyografya
| Parent link: | Korus 2001: The 5th Korea-Russia International Symposium on Science and Technology/ Томский политехнический университет ; KORUS.— , 2001-
Vol. 2.— 2001-.— P. 282-283 |
|---|
| Diğer Yazarlar: |
Pokholkov Y. P. Yuri Petrovich,
Dudkin A. N.,
Leonov A. P.,
Maryin S. S. |
|---|
| Özet: | Reason of failure of low-voltage insulation is the occurrence of a short circuit between parts, conducting an electrical current, with different potentials. Criterion of failure - presence of through defect in insulation. The mechanism of failure of low-voltage insulation systems consists in occurrence of bits in places of through damages (defects) under operation of commutative overvoltages and maintenance of bit by a running voltage. The influence of the constructive, technological and operation factors on derivation of defects is marked. For support of given reliability of insulation systems of low-voltage windings the methods of estimation of state and compatibility of builders of systems, methods of choice and calculation of modes of technological processes of winding, impregnation and subsequent heat treatment of low-voltage windings designed |
|---|
| Baskı/Yayın Bilgisi: |
2001-
|
|---|
| Konular: | |
|---|
| Materyal Türü: | Kitap Bölümü
|
|---|
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=239405 |
|---|
