Non-Etalon Atomic Emission Method of Quantitative Element Analysis of Materials

Non-Etalon Atomic Emission Method of Quantitative Element Analysis of Materials

Xehetasun bibliografikoak
Parent link:7 International conference on modification of materials with particle beams and plasma flows: Tomsk, Russia, 25-29 July 2004/ edited by S. Korovin, A. Ryabchikov. [P. 503-505].— , 2004
Egile nagusia: Stepanov I. B. Igor Borisovich
Beste egile batzuk: Shulepov I. A. Ivan Anisimovich, Mankov G. V.
Gaia:Title from the title-page.
The paper presents the results of investigation of the method of qualitative element analysis for the spectroanalytical complex ДФС-458C. The proposed method allows minimize factors (alternating value of arc current, change in location of a light spot with respect to input slot, etc. for arc excitation) influencing non-controlled change in intensity of spectral lines, used to calculate element concentration. Thus, the method permits use of etalon spectra atlases for qualitative research.
Режим доступа: из корпоративной сети ТПУ
Text files
Argitaratua: 2004
Saila:Diagnostics of modified materials
Gaiak:
физика
спектральные линии
спектры
спектрографы
спектроаналитические установки
качественный анализ
качественные исследования
труды учёных ТПУ
электронный ресурс
Sarrera elektronikoa:http://www.lib.tpu.ru/fulltext2/c/2004/C13/053.pdf
Formatua: Baliabide elektronikoa Liburu kapitulua
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=234136

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