Non-Etalon Atomic Emission Method of Quantitative Element Analysis of Materials; 7 International conference on modification of materials with particle beams and plasma flows
| Parent link: | 7 International conference on modification of materials with particle beams and plasma flows.— 2004.— [P. 503-505] |
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| Autore principale: | |
| Altri autori: | , |
| Riassunto: | Title from the title-page. The paper presents the results of investigation of the method of qualitative element analysis for the spectroanalytical complex ДФС-458C. The proposed method allows minimize factors (alternating value of arc current, change in location of a light spot with respect to input slot, etc. for arc excitation) influencing non-controlled change in intensity of spectral lines, used to calculate element concentration. Thus, the method permits use of etalon spectra atlases for qualitative research. Режим доступа: из корпоративной сети ТПУ Text files |
| Lingua: | inglese |
| Pubblicazione: |
2004
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| Serie: | Diagnostics of modified materials |
| Soggetti: | |
| Accesso online: | http://www.lib.tpu.ru/fulltext2/c/2004/C13/053.pdf |
| Natura: | MixedMaterials Elettronico Capitolo di libro |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=234136 |