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Fundamental of Nanoscale Film Analysis

Fundamental of Nanoscale Film Analysis

Bibliographic Details
Main Author: Alford T. L. Terry L.
Other Authors: Feldman L. C. Leonard C., Mayer J. W. James W.
Published: New York, Springer, 2007
Subjects:
физика
твердые тела
структурный анализ
монокристаллы
нанокристаллы
наноструктуры
измерения
электронная микроскопия
свойства
исследование
оборудование
английский язык
Format: Book
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=140255
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Description
Physical Description:336 p. il.
ISBN:9780387292601

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