検索結果 - Samuelson L. Lars

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  1. 1
    X-ray Bragg Ptychography on a Single InGaN/GaN Core-Shell Nanowire; ACS Nano; Vol. 11, iss. 7

    X-ray Bragg Ptychography on a Single InGaN/GaN Core-Shell Nanowire; ACS Nano; Vol. 11, iss. 7

    出版事項 2017
    その他の著者: 全文の入手
    電子媒体 図書の章
  2. 2
    Revealing misfit dislocations in InAs x P1−x -InP core-shell nanowires by x-ray diffraction; Nanotechnology; Vol. 30, iss. 50

    Revealing misfit dislocations in InAs x P1−x -InP core-shell nanowires by x-ray diffraction; Nanotechnology; Vol. 30, iss. 50

    出版事項 2019
    その他の著者: 全文の入手
    電子媒体 図書の章
  3. 3
    Influence of Contacts and Applied Voltage on a Structure of a Single GaN Nanowire; Applied Sciences; Vol. 11, iss. 20

    Influence of Contacts and Applied Voltage on a Structure of a Single GaN Nanowire; Applied Sciences; Vol. 11, iss. 20

    出版事項 2021
    その他の著者: 全文の入手
    電子媒体 図書の章
  4. 4
    Bragg coherent x-ray diffractive imaging of a single indium phosphide nanowire; Journal of Optics; Vol. 18, iss. 6

    Bragg coherent x-ray diffractive imaging of a single indium phosphide nanowire; Journal of Optics; Vol. 18, iss. 6

    出版事項 2016
    その他の著者: 全文の入手
    電子媒体 図書の章

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