Rezultati pretrage - Samuelson L. Lars

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  1. 1
    X-ray Bragg Ptychography on a Single InGaN/GaN Core-Shell Nanowire; ACS Nano; Vol. 11, iss. 7

    X-ray Bragg Ptychography on a Single InGaN/GaN Core-Shell Nanowire; ACS Nano; Vol. 11, iss. 7

    Izdano 2017
    Daljnji autori: Preuzmi cijeli tekst
    Elektronički Poglavlje knjige
  2. 2
    Revealing misfit dislocations in InAs x P1−x -InP core-shell nanowires by x-ray diffraction; Nanotechnology; Vol. 30, iss. 50

    Revealing misfit dislocations in InAs x P1−x -InP core-shell nanowires by x-ray diffraction; Nanotechnology; Vol. 30, iss. 50

    Izdano 2019
    Daljnji autori: Preuzmi cijeli tekst
    Elektronički Poglavlje knjige
  3. 3
    Influence of Contacts and Applied Voltage on a Structure of a Single GaN Nanowire; Applied Sciences; Vol. 11, iss. 20

    Influence of Contacts and Applied Voltage on a Structure of a Single GaN Nanowire; Applied Sciences; Vol. 11, iss. 20

    Izdano 2021
    Daljnji autori: Preuzmi cijeli tekst
    Elektronički Poglavlje knjige
  4. 4
    Bragg coherent x-ray diffractive imaging of a single indium phosphide nanowire; Journal of Optics; Vol. 18, iss. 6

    Bragg coherent x-ray diffractive imaging of a single indium phosphide nanowire; Journal of Optics; Vol. 18, iss. 6

    Izdano 2016
    Daljnji autori: Preuzmi cijeli tekst
    Elektronički Poglavlje knjige

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